Transmission Electron Microscope

The NanoVision Centre houses a Jeol JEM-F200, a high-resolution Scanning Transmission Electron Microscope, and a Jeol JEM-1400, high-contrast Transmission Electron Microscope.

JEM-F200 Scanning Transmission Electron Microscope

JEM-F200 is a state-of-art high-resolution and analytical Scanning Transmission Electron Microscope. It is a 200 kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread that allows atomic resolution imaging, and with dual Silicon Drift Detectors (SDD) which enable high sensitivity and throughput for X-ray (chemical) analysis.

 

Jeol JEM-F200 STEM

  • Accelerating Voltage: 200 kV
  • Alignment: 60 kV and 200 kV
  • Pole-Piece: High-Resolution
  • Gun: Cold-FEG
  • TEM Resolution: 0.1 nm
  • STEM Resolution: 0.16 nm
  • EDS Detectors: 2 x 100 mm2 
  • Camera: Gatan One View  (Image: 16 MP, Video: 4k @ 25fps, 1k @ 200 fps)
  • Holders: Standard Single-Tilt, Be Analytical Double-Tilt and Analytical High-Tilt Tomography

 

 

 

 

 

 

JEM-1400 Flash Transmission Electron Microscope 

The JEM-1400 Flash TEM is optimised for high-contrast imaging of soft matter specimens.

  • Accelerating Voltage: 10 - 120 kV
  • Gun: LaB6
  • Pole Piece: High Contrast
  • TEM Resolution: 0.2 nm
  • Magnification: x10 to x1,200,0001400 Flash
  • Holder: Standard Single Tilt Holder and Penta-Holder
  • Camera: Gatan Orius and Olympus Morada

 

 

Negatively stained amyloid fibril.Mouse heart tissue.Self-assembled monolayer of 4 nm gold nanoparticles (AuNP) coated with dodecanethiol.